Lateral damage in graphene carved by high energy focused gallium ion beams

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

Zhongquan Liao - , Chair of Materials Science and Nanotechnology, Dresden Center for Nanoanalysis (DCN) (Author)
Tao Zhang - , Chair of Macromolecular Chemistry (Author)
Martin Gall - , Fraunhofer Institute for Ceramic Technologies and Systems (Author)
Arezoo Dianat - , Chair of Materials Science and Nanotechnology (Author)
Ruediger Rosenkranz - , Fraunhofer Institute for Ceramic Technologies and Systems (Author)
Rainer Jordan - , Chair of Macromolecular Chemistry (Author)
Gianaurelio Cuniberti - , Chair of Materials Science and Nanotechnology, Center for Advancing Electronics Dresden (cfaed) (Author)
Ehrenfried Zschech - , Dresden Center for Nanoanalysis (DCN), Fraunhofer Institute for Ceramic Technologies and Systems (Author)

Graphene, Ion beams, Focused ion beam technology, Ion radiation effects, raman spectra, Raman mapping