Investigation of the reliability degradation of scaled SONOS memory transistors

Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review

Contributors

J. Ocker - (Author)
S. Slesazeck - (Author)
R. Hoffmann - , Department of Child and Adolescent Psychiatry and Psychotherapy (Author)
V. Beyer - , University Center for Orthopedics, Trauma and Plastic Surgery (Author)
A. Skouris - (Author)
R. Srowik - (Author)
S. Buschbeck - (Author)
S. Gunther - (Author)
T. Mikolajick - , Chair of Nanoelectronics (Author)

Original language	English
Title of host publication	2015 IEEE International Integrated Reliability Workshop Final Report (IIRW)
Publisher	IEEE Xplore
Number of pages	4
Volume	2015
ISBN (electronic)	978-1-4673-7396-8, 978-1-4673-7394-4
ISBN (print)	978-1-4673-7395-1
Publication status	Published - 2016
Peer-reviewed	Yes

Series	IEEE International Integrated Reliability Workshop (IIRW)
ISSN	1930-8841

Scopus	84964617155