Investigation of the reliability degradation of scaled SONOS memory transistors
Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Title of host publication | 2015 IEEE International Integrated Reliability Workshop Final Report (IIRW) |
| Publisher | IEEE Xplore |
| Number of pages | 4 |
| Volume | 2015 |
| ISBN (electronic) | 978-1-4673-7396-8, 978-1-4673-7394-4 |
| ISBN (print) | 978-1-4673-7395-1 |
| Publication status | Published - 2016 |
| Peer-reviewed | Yes |
Publication series
| Series | IEEE International Integrated Reliability Workshop (IIRW) |
|---|---|
| ISSN | 1930-8841 |
External IDs
| Scopus | 84964617155 |
|---|