Investigation of nanometer scale charge carrier density variations with scattering-type scanning near-field microscopy in the THz regime

Research output: Types of thesis › Doctoral thesis

Contributors

Details

Original languageEnglish
Qualification levelDr. rer. nat.
Awarding Institution
Supervisors/Advisors
  • Eng, Lukas, Reviewer
  • Kehr, Susanne, Main supervisor
Defense Date (Date of certificate)16 Jul 2019
Publication statusPublished - 2019
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Keywords

Research priority areas of TU Dresden

Keywords

  • SNOM, THz regime, graphene, FET