Investigation of nanometer scale charge carrier density variations with scattering-type scanning near-field microscopy in the THz regime

Research output: Types of ThesisDoctoral thesis

Contributors

  • Kuschewski Frederik - (Author)

Details

Original languageEnglish
Qualification levelDr. rer. nat.
Awarding Institution
Supervisors/Advisors
  • Eng, Lukas, Reviewer
  • Kehr, Susanne, Main supervisor
Defense Date (Date of certificate)16 Jul 2019
Publication statusPublished - 2019
No renderer: customAssociatesEventsRenderPortal,dk.atira.pure.api.shared.model.researchoutput.Thesis

Keywords

Keywords

  • SNOM, THz regime, graphene, FET