Impact of hot carrier stress on small-signal parameters of FD-SOI NMOSFETs

Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review

Contributors

Details

Original languageEnglish
Title of host publication2017 IEEE International Integrated Reliability Workshop (IIRW)
ISBN (electronic)978-1-5386-2332-9
Publication statusPublished - 2018
Peer-reviewedYes

Publication series

SeriesIEEE International Integrated Reliability Workshop (IIRW)
ISSN1930-8841

External IDs

Scopus 85047784063

Keywords