Future trends in charge trapping memories
Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review
Contributors
Abstract
Charge trapping memories offer advantages for scaling data flash memories in the sub 50nm groundrule. This paper reviews the progress of the main concepts in charge trapping, NROM and SONOS. Both have undergone significant new developments, like the 4 bits/cell for the NROM and the introduction of new materials for SONOS and new cell structures e.g. including Fin-Fet's. Depending on the progress during the next years these concepts will be even more able to compete with the still dominating floating gate techniques.
Details
Original language | English |
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Title of host publication | ICSICT-2006 |
Publisher | IEEE Computer Society |
Pages | 740-743 |
Number of pages | 4 |
ISBN (print) | 1424401615, 9781424401611 |
Publication status | Published - 2006 |
Peer-reviewed | Yes |
Externally published | Yes |
Publication series
Series | ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings |
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Conference
Title | ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology |
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Duration | 23 - 26 October 2006 |
City | Shanghai |
Country | China |
External IDs
ORCID | /0000-0003-3814-0378/work/156338378 |
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