Exploiting transistor-level reconfiguration to optimize combinational circuits

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Details

Original languageEnglish
Title of host publicationProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
Publication statusPublished - 2017
Peer-reviewedYes

External IDs

Scopus 85014200161

Keywords