Electrical stress on intrinsically conductive polymer layer

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • Detlef Bonfert - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Dieter Hemmetzberger - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Indranil Bose - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Gerhard Klink - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Karlheinz Bock - , Chair of Electronic Packaging Technology, Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT), Technical University of Munich (Author)
  • Paul Svasta - , Polytechnic University of Bucharest (Author)
  • Ciprian Ionescu - , Polytechnic University of Bucharest (Author)

Abstract

There is a necessity to include sensors (resistors) in the design of organic electronic systems in order to extend the range of possible applications. It is essential to identify potential resistive materials, the processes and methods to structure them and to analyze their resistive properties on flexible substrates. One material widely used in organic electronics is the intrinsically conductive polymer (ICP) poly (3, 4-ethylendioxythiophene) doped with polystyrene sulfonate acid (PEDOT:PSS). In this paper we focus on the DC- and pulsed stress behavior of this conductive polymer on flexible substrates and the resulting changes of his resistive properties.

Details

Original languageGerman
Title of host publication2012 35th International Spring Seminar on Electronics Technology
PublisherIEEE
Pages270-275
Number of pages6
ISBN (print)978-1-4673-2239-3
Publication statusPublished - 13 May 2012
Peer-reviewedYes

Conference

Title2012 35th International Spring Seminar on Electronics Technology
SubtitlePower Electronics
Abbreviated titleISSE 2012
Conference number35
Duration9 - 13 May 2012
LocationCongress Center
CityBad Aussee
CountryAustria

External IDs

Scopus 84867085939
ORCID /0000-0002-0757-3325/work/139064844

Keywords

Keywords

  • Positron emission tomography, Resistance, Transmission line measurements, Current measurement, Voltage measurement, Semiconductor device measurement, Electrical resistance measurement