Effect of independently sized gates on the delay of reconfigurable silicon nanowire transistor based circuits

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Contributors

Abstract

Reconfigurable silicon nanowire field effect transistors (RFETs) provide both operation modes of p-type and n-type field effect transistors in a single multigate device. This unique feature provides additional degrees of freedom in terms of circuit design and device layout. Here a device-circuit co-design study of a novel 1-bit full adder with only 20 transistors is presented. The delay of the adder is analyzed using the logical effort theory and compared to standard CMOS implementation. The effect of independent gate sizing on device and circuit characteristics will be discussed. It will be shown that asymmetric gates can be exploited to reduce the critical delay of the new adder by 15 %, although the individual device performance is kept constant.

Details

Original languageEnglish
Title of host publicationEUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages17-20
Number of pages4
ISBN (electronic)9781479969111
Publication statusPublished - 18 Mar 2015
Peer-reviewedYes

Publication series

SeriesInternational Conference on Ultimate Integration of Silicon, ULIS

Conference

Title2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2015
Duration26 - 28 January 2015
CityBologna
CountryItaly

External IDs

ORCID /0000-0003-3814-0378/work/142256290

Keywords

ASJC Scopus subject areas

Keywords

  • device-circuit co-design, functional enhanced devices, logic gates, logical effort, multigate, polarity control, reconfigurable transistor, RFET, Schottky barrier, Schottky field effect transistor, silicon nanowires