Distribution of electrical resistivity in single carbon fiber filaments and its correlation with tensile modulus

Research output: Contribution to journalResearch articleContributedpeer-review

Abstract

Understanding the probabilistic distribution of the electrical properties of carbon fibers (CFs) at the filament level is crucial for the development of function-integrative composite materials and the design of tailored CFs. While models describing the distribution of CF tensile strength are well established, the distribution of electrical resistivity remains largely unexplored. This work presents a comprehensive quantitative description of resistivity distribution at the single filament level and extends the established correlation with the tensile modulus from the scale of fiber bundles to individual filaments. The study is based on extensive experimental characterization of two commercially available CF, PAN-based HTA40 and pitch-based YSH-70A-10S. Maximum likelihood estimation (MLE) and the Akaike information criterion (AIC) are applied to evaluate the distribution of filament resistivities. The results indicate that the electrical resistivity distributions can be accurately described by either Weibull or Gamma distributions. Furthermore, the correlation between the electrical resistivity and tensile modulus of filaments is analyzed, and the influence of diameter variations on the observed distributions and correlations is discussed.

Details

Original languageEnglish
Article numbere202502730
Number of pages8
JournalAdvanced Engineering Materials
Volume28
Issue number6
Early online date8 Feb 2026
Publication statusPublished - 18 Mar 2026
Peer-reviewedYes

External IDs

ORCID /0000-0002-8854-7726/work/205331605
ORCID /0000-0002-4859-4325/work/205332806
ORCID /0000-0003-1370-064X/work/205333752
ORCID /0000-0003-4967-5773/work/205335002
ORCID /0000-0003-1385-1528/work/205335046
ORCID /0009-0001-7932-7086/work/205336942
Scopus 105029419150
WOS 001683252000001

Keywords

Keywords

  • filament diameter, filament testing, maximum likelihood estimation, TEM, Weibull distribution