Direct Observation of Negative Capacitance in Polycrystalline Ferroelectric HfO2

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • M. Hoffmann - , NaMLab - Nanoelectronic materials laboratory gGmbH, University of California at Berkeley (Author)
  • Milan Pešić - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • K. Chatterjee - , University of California at Berkeley (Author)
  • A.I. Khan - , University of California at Berkeley (Author)
  • S. Salahuddin - , University of California at Berkeley, Lawrence Berkeley National Laboratory (Author)
  • S. Slesazeck - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • U. Schroeder - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • T. Mikolajick - , Chair of Nanoelectronics, NaMLab - Nanoelectronic materials laboratory gGmbH (Author)

Details

Original languageEnglish
Pages (from-to)8643-8649
JournalAdvanced functional materials
Volume26
Issue number47
Publication statusPublished - 2016
Peer-reviewedYes

External IDs

Scopus 84996503541

Keywords

Library keywords