Detailed analysis of oxide related charges and metal-oxide barriers in terrace etched Al2O3 and HfO2 on AlGaN/GaN heterostructure capacitors

Research output: Contribution to journalResearch articleContributedpeer-review

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Original languageEnglish
Article number124106
JournalJournal of applied physics
Volume118
Issue number12
Publication statusPublished - 25 Sept 2015
Peer-reviewedYes

External IDs

Scopus 84942543476