Adv. Mater. Interfaces 2019, 6, 1900042 The captions of the Figures 2 and 3 were interchanged in the original manuscript. Please find the figures with the correct captions below. (Figure presented.) Number of cycles to break down HfO₂ films as a function of film thickness and annealing temperature. Cycling was stopped after 10⁸ electrical field cycles were reached. (Figure presented.) Thickness dependence of the double remanent polarization 2P_r of ALD and PVD HfO₂-based metal–insulator–metal (MIM) capacitors.^[17] The broken lines are guides to the eyes. The editorial office apologizes for any inconvenience or misunderstanding that this error may have caused.