Characterization of Embedded and Thinned RF Chips

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Abstract

This work studies the effect of thinning down chips with transmission line structures for flexible embedding technology. Test chips with 90 Ω grounded coplanar waveguide (G-CPW) transmission lines have been designed and manufactured to characterize the high-frequency performance before and after embedding in sheet molding compound (SMC), and thinning down from 300 µm to 20 µm, Molding first technology enables single-die or multiple-die thinning with the embedding material while being held in the exact position, where the subsequent fan-out copper (Cu) redistribution layer (RDL) structuring realizes the direct contacts to the embedded chip, followed by semi-additive manufacturing of traces. The embedded and thinned chips are characterized by S-parameter measurements in the frequency range from 20 MHz to 65 GHz using a vector network analyzer (VNA). The results show the feasibility of the examined embedding and thinning processes which are suitable for millimeter wave (mmWave) components as shown by the example of a G-CPW transmission line without degrading its RF performance in terms of characteristic impedance and attenuation.

Details

Original languageEnglish
Title of host publication2023 24th European Microelectronics and Packaging Conference & Exhibition (EMPC)
PublisherIEEE
Pages1-6
Number of pages6
ISBN (electronic)9780956808691
ISBN (print)978-1-6654-8736-8
Publication statusPublished - 14 Sept 2023
Peer-reviewedYes

Conference

Title2023 24th European Microelectronics and Packaging Conference & Exhibition
SubtitleWhat future do you want to connect with?
Abbreviated titleEMPC 2023
Conference number24
Duration11 - 14 September 2023
Website
Degree of recognitionInternational event
LocationWellcome Genome Campus
CityHinxton
CountryUnited Kingdom

External IDs

Scopus 85186139775
ORCID /0000-0001-6778-7846/work/155291624
ORCID /0000-0003-1319-0870/work/155292029
ORCID /0000-0002-0757-3325/work/155292325
ORCID /0000-0003-2197-6080/work/155292463

Keywords

Keywords

  • Frequency measurement, Radio frequency, Scattering parameters, Semiconductor device measurement, Sensor phenomena and characterization, Thermomechanical processes, Transmission line measurements