MRS Advances

ISSNs: 2059-8521

Additional searchable ISSN (electronic): 2059-8521

Springer Nature

Scopus rating (2025): CiteScore 1.7 SJR 0.272 SNIP 0.462

Journal

Titles	MRS Advances MRS advances
ISSNs	2059-8521
Additional searchable ISSN (electronic)	2059-8521
Publisher	Springer Nature
ZDB-ID	2858562-8

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670 Manufacturing

Impact of the interface layer on the cycling behaviour and retention of ferroelectric hafnium oxide

Lederer, M., Mertens, K., Kia, A. M., Emara, J., Olivo, R., Raffel, Y. & Lehninger, D. & 5 others, Ali, T., Kühnel, K., Seidel, K., Kämpfe, T. & Eng, L. M., Aug 2021, In: MRS advances. 6, 21, p. 525-529 5 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Monolayer-enriched production of Au-decorated WS² Nanosheets via Defect Engineering

Dunklin, J. R., Lafargue, P., Higgins, T. M., Forcherio, G. T., Benamara, M., McEvoy, N. & Keith Roper, D. & 3 others, Coleman, J. N., Vaynzof, Y. & Backes, C., 2018, In: MRS advances. 3, 41, p. 2435-2440 6 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

On Razors Edge: Influence of the Source Insulator Edge on the Charge Transport of Vertical Organic Field Effect Transistors

Sawatzki, F. M., Hauke, A. A., Doan, D. H., Formanek, P., Kasemann, D., Koprucki, T. & Leo, K., 2017, In: MRS advances. 2, 23, p. 1249-1257 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Elastic and Plastic Stress Relaxation in Highly Mismatched SiGe/Si Crystals

Isa, F., Jung, A., Salvalaglio, M., Dasilva, Y. A. R., Meduna, M., Barget, M. & Kreiliger, T. & 11 others, Isella, G., Erni, R., Pezzoli, F., Bonera, E., Niedermann, P., Zweiacker, K., Neels, A., Dommann, A., Groning, P., Montalenti, F. & von Kanel, H., 2016, In: MRS advances. 1, 50, p. 3403-3408 6 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

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MRS Advances

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Related content

Impact of the interface layer on the cycling behaviour and retention of ferroelectric hafnium oxide

Monolayer-enriched production of Au-decorated WS² Nanosheets via Defect Engineering

On Razors Edge: Influence of the Source Insulator Edge on the Charge Transport of Vertical Organic Field Effect Transistors

Elastic and Plastic Stress Relaxation in Highly Mismatched SiGe/Si Crystals