X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Arman Davtyan - , University of Siegen (Author)
  • Dominik Kriegner - , Clusters of Excellence ct.qmat: Complexity and Topology in Quantum Matter, TUD Dresden University of Technology (Author)
  • Vaclav Holy - , Charles University Prague (Author)
  • Ali AlHassan - , University of Siegen (Author)
  • Ryan B. Lewis - , Paul Drude Institute for Solid State Electronics (Author)
  • Spencer McDermott - , McMaster University (Author)
  • Lutz Geelhaar - , Paul Drude Institute for Solid State Electronics (Author)
  • Danial Bahrami - , University of Siegen (Author)
  • Taseer Anjum - , University of Siegen (Author)
  • Zhe Ren - , Lund University (Author)
  • Carsten Richter - , Leibniz Institute for Crystal Growth (Author)
  • Dmitri Novikov - , German Electron Synchrotron (DESY) (Author)
  • Julian Mueller - , University of Siegen (Author)
  • Benjamin Butz - , University of Siegen (Author)
  • Ullrich Pietsch - , University of Siegen (Author)

Abstract

Core-shell nanowires (NWs) with asymmetric shells allow for strain engineering of NW properties because of the bending resulting from the lattice mismatch between core and shell material. The bending of NWs can be readily observed by electron microscopy. Using X-ray diffraction analysis with a micro- and nano-focused beam, the bending radii found by the microscopic investigations are confirmed and the strain in the NW core is analyzed. For that purpose, a kinematical diffraction theory for highly bent crystals is developed. The homogeneity of the bending and strain is studied along the growth axis of the NWs, and it is found that the lower parts, i.e. close to the substrate/wire interface, are bent less than the parts further up. Extreme bending radii down to similar to 3 mu m resulting in strain variation of similar to 2.5% in the NW core are found.

Details

Original languageEnglish
Pages (from-to)1310-1320
Number of pages11
JournalJournal of applied crystallography
Volume53
Publication statusPublished - Oct 2020
Peer-reviewedYes

External IDs

Scopus 85092573337

Keywords

Keywords

  • nano-focused X-ray beams, nanowires, bent crystals, MICROSCOPY, CRYSTALS