When to Sample from Feature Diagrams?

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Abstract

Uniform random sampling (URS) has many applications in configurable systems analysis. Usually, feature models consisting of a hierarchical feature diagram and additional side constraints specify the space of valid configurations to be sampled from. However, URS has predominately been applied on feature models translated a priori into conjunctive normal form (CNF). In this work, we study URS approaches that instead operate directly on feature diagrams and provide a comparative evaluation of their performance against well-established URS tools for CNF representations. Our findings suggest that translating feature models to CNF offers advantages, even in the presence of only few side constraints.

Details

Original languageEnglish
Title of host publicationVaMoS'25: Proceedings of the 19th International Working Conference on Variability Modelling of Software-Intensive Systems
EditorsMathieu Acher, Juliana Alves Pereira, Clément Quinton
PublisherACM Digital Library
Pages11-20
Number of pages10
ISBN (electronic)9798400714412
Publication statusPublished - 28 May 2025
Peer-reviewedYes

Conference

Title19th International Working Conference on Variability Modelling of Software-Intensive Systems
Abbreviated titleVaMoS 2025
Conference number19
Duration4 - 6 February 2025
Website
LocationInria Conference center
CityRennes
CountryFrance

External IDs

ORCID /0000-0002-5321-9343/work/185738305
unpaywall 10.1145/3715340.3715442
Mendeley 885b39d7-1620-30ce-bdae-d041af86bf71
Scopus 105010222484

Keywords