When to Sample from Feature Diagrams?
Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Contributors
Abstract
Uniform random sampling (URS) has many applications in configurable systems analysis. Usually, feature models consisting of a hierarchical feature diagram and additional side constraints specify the space of valid configurations to be sampled from. However, URS has predominately been applied on feature models translated a priori into conjunctive normal form (CNF). In this work, we study URS approaches that instead operate directly on feature diagrams and provide a comparative evaluation of their performance against well-established URS tools for CNF representations. Our findings suggest that translating feature models to CNF offers advantages, even in the presence of only few side constraints.
Details
| Original language | English |
|---|---|
| Title of host publication | VaMoS'25: Proceedings of the 19th International Working Conference on Variability Modelling of Software-Intensive Systems |
| Editors | Mathieu Acher, Juliana Alves Pereira, Clément Quinton |
| Publisher | ACM Digital Library |
| Pages | 11-20 |
| Number of pages | 10 |
| ISBN (electronic) | 9798400714412 |
| Publication status | Published - 28 May 2025 |
| Peer-reviewed | Yes |
Conference
| Title | 19th International Working Conference on Variability Modelling of Software-Intensive Systems |
|---|---|
| Abbreviated title | VaMoS 2025 |
| Conference number | 19 |
| Duration | 4 - 6 February 2025 |
| Website | |
| Location | Inria Conference center |
| City | Rennes |
| Country | France |
External IDs
| ORCID | /0000-0002-5321-9343/work/185738305 |
|---|---|
| unpaywall | 10.1145/3715340.3715442 |
| Mendeley | 885b39d7-1620-30ce-bdae-d041af86bf71 |
| Scopus | 105010222484 |
Keywords
ASJC Scopus subject areas
Keywords
- Feature Models, BDDs, Uniform Random Sampling