When to Sample from Feature Diagrams?

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

Abstract

Uniform random sampling (URS) has many applications in configurable systems analysis. Usually, feature models consisting of a hierarchical feature diagram and additional side constraints specify the space of valid configurations to be sampled from. However, URS has predominately been applied on feature models translated a priori into conjunctive normal form (CNF). In this work, we study URS approaches that instead operate directly on feature diagrams and provide a comparative evaluation of their performance against well-established URS tools for CNF representations. Our findings suggest that translating feature models to CNF offers advantages, even in the presence of only few side constraints.

Details

OriginalspracheEnglisch
TitelVaMoS'25: Proceedings of the 19th International Working Conference on Variability Modelling of Software-Intensive Systems
Redakteure/-innenMathieu Acher, Juliana Alves Pereira, Clément Quinton
Herausgeber (Verlag)ACM Digital Library
Seiten11-20
Seitenumfang10
ISBN (elektronisch)9798400714412
PublikationsstatusVeröffentlicht - 28 Mai 2025
Peer-Review-StatusJa

Konferenz

Titel19th International Working Conference on Variability Modelling of Software-Intensive Systems
KurztitelVaMoS 2025
Veranstaltungsnummer19
Dauer4 - 6 Februar 2025
Webseite
OrtInria Conference center
StadtRennes
LandFrankreich

Externe IDs

ORCID /0000-0002-5321-9343/work/185738305
unpaywall 10.1145/3715340.3715442
Mendeley 885b39d7-1620-30ce-bdae-d041af86bf71
Scopus 105010222484

Schlagworte

Schlagwörter

  • Feature Models, BDDs, Uniform Random Sampling