Using the Right Two-Ray Model? A Measurement based Evaluation of PHY Models in VANETs

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

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Details

Original languageUndefined
Title of host publication17th ACM International Conference on Mobile Computing and Networking (MobiCom 2011), Poster Session
Place of PublicationLas Vegas, NV
PublisherACM Press
Publication statusPublished - 1 Sept 2011
Peer-reviewedYes

Keywords