Understanding the Role of Defects in Silicon Nitride-Based Resistive Switching Memories through Oxygen Doping

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • N. Vasileiadis - , Democritus University of Thrace (Author)
  • P. Karakolis - , Demokritos National Centre for Scientific Research (Author)
  • Panagiotis Mandylas - , Demokritos National Centre for Scientific Research (Author)
  • V. Ioannou-Sougleridis - , Demokritos National Centre for Scientific Research (Author)
  • Pascal Normand - , Demokritos National Centre for Scientific Research (Author)
  • Michele Perego - , Demokritos National Centre for Scientific Research (Author)
  • Philomela Komninou - , Aristotle University of Thessaloniki (Author)
  • V. Ntinas - , Democritus University of Thrace (Author)
  • I.-A. Fyrigos - , Democritus University of Thrace (Author)
  • I.G. Karafyllidis - , Democritus University of Thrace (Author)
  • Georgios Ch Sirakoulis - , Democritus University of Thrace (Author)
  • Panagiotis Dimitrakis - , Demokritos National Centre for Scientific Research (Author)

Details

Original languageEnglish
JournalIEEE transactions on nanotechnology
Publication statusPublished - 2021
Peer-reviewedYes
Externally publishedYes

External IDs

Scopus 85104259499

Keywords