The Scale4Edge RISC-V Ecosystem

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • Wolfgang Ecker - , Infineon Technologies AG (Author)
  • Peer Adelt - , Paderborn University (Author)
  • Wolfgang Mueller - , Paderborn University (Author)
  • Reinhold Heckmann - , AbsInt Angewandte Informatik GmbH (Author)
  • Milos Krstic - , University of Potsdam (Author)
  • Vladimir Herdt - , University of Bremen (Author)
  • Rolf Drechsler - , University of Bremen (Author)
  • Gerhard Angst - , Concept Engineering GmbH (Author)
  • Ralf Wimmer - , Concept Engineering GmbH (Author)
  • Andreas Mauderer - , Robert Bosch GmbH (Author)
  • Rafael Stahl - , Technical University of Munich (Author)
  • Karsten Emrich - , Technical University of Munich (Author)
  • Daniel Mueller-Gritschneder - , Technical University of Munich (Author)
  • Bernd Becker - , University of Freiburg (Author)
  • Philipp Scholl - , University of Freiburg (Author)
  • Eyck Jentzsch - , MINRES Technologies GmbH (Author)
  • Jan Schlamelcher - , OFFIS - Institute for Information Technology (Author)
  • Kim Gruttner - , OFFIS - Institute for Information Technology (Author)
  • Paul Palomero Bernardo - , University of Tübingen (Author)
  • Oliver Bringmann - , University of Tübingen (Author)
  • Mihaela Damian - , Technische Universität Darmstadt (Author)
  • Julian Oppermann - , Technische Universität Darmstadt (Author)
  • Andreas Koch - , Technische Universität Darmstadt (Author)
  • Jorg Bormann - , Siemens AG (Author)
  • Johannes Partzsch - , Chair of Highly-Parallel VLSI Systems and Neuro-Microelectronics (Author)
  • Christian Mayr - , Chair of Highly-Parallel VLSI Systems and Neuro-Microelectronics (Author)
  • Wolfgang Kunz - , University of Kaiserslautern-Landau (Author)

Abstract

This paper introduces the project Scale4Edge. The project is focused on enabling an effective RISC-V ecosystem for optimization of edge applications. We describe the basic components of this ecosystem and introduce the envisioned demonstrators, which will be used in their evaluation.

Details

Original languageEnglish
Title of host publicationProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
EditorsCristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages808-813
Number of pages6
ISBN (electronic)978-3-9819263-6-1
Publication statusPublished - 2022
Peer-reviewedYes

Publication series

SeriesDesign, Automation and Test in Europe Conference and Exhibition (DATE)
ISSN1530-1591

Conference

Title2022 Design, Automation and Test in Europe Conference and Exhibition
Abbreviated titleDATE 2022
Conference number25
Duration14 - 23 March 2022
Website
LocationOnline
CityAntwerp
CountryBelgium

External IDs

ORCID /0000-0002-6286-5064/work/160048711

Keywords

ASJC Scopus subject areas

Keywords

  • ecosystem, edge applications, RISC-V