Surface photovoltage spectroscopy for the investigation of perovskite oxide interfaces

Research output: Contribution to journalConference articleContributedpeer-review



In the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO 3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO 3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.


Original languageEnglish
Pages (from-to)189-199
Number of pages11
JournalMaterials Research Society Symposium Proceedings
Publication statusPublished - 2005


Title2005 MRS Fall Meeting
Duration28 November - 2 December 2005
CityBoston, MA
CountryUnited States of America

External IDs

Scopus 34249931004
ORCID /0000-0003-1899-603X/work/142240049
ORCID /0000-0002-2484-4158/work/142257538