Soft error-aware architectural exploration for designing reliability adaptive cache hierarchies in multi-cores

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Contributors

Abstract

Mainstream multi-core processors employ large multilevel on-chip caches making them highly susceptible to soft errors. We demonstrate that designing a reliable cache hierarchy requires understanding the vulnerability interdependencies across different cache levels. This involves vulnerability analyses depending upon the parameters of different cache levels (partition size, line size, etc.) and the corresponding cache access patterns for different applications. This paper presents a novel soft error-aware cache architectural space exploration methodology and vulnerability analysis of multi-level caches considering their vulnerability interdependencies. Our technique significantly reduces exploration time while providing reliability-efficient cache configurations. We also show applicability/benefits for ECC-protected caches under multi-bit fault scenarios.

Details

Original languageEnglish
Title of host publicationDesign, Automation & Test in Europe Conference & Exhibition (DATE), 2017
Place of PublicationLausanne
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages37-42
Number of pages6
ISBN (electronic)978-3-9815370-8-6, 978-3-9815370-9-3
ISBN (print)978-1-5090-5826-6
Publication statusPublished - 11 May 2017
Peer-reviewedYes

Publication series

SeriesDesign, Automation and Test in Europe Conference and Exhibition (DATE)
ISSN1530-1591

Conference

Title20th Design, Automation and Test in Europe
Abbreviated titleDATE 2017
Conference number20
Duration27 - 31 March 2017
Website
Degree of recognitionInternational event
LocationSwisstech
CityLausanne
CountrySwitzerland