Short-wavelength photoluminescence of SiO2 layers implanted with high doses of Si+, Ge+, and Ar+ ions
Research output: Contribution to journal › Research article › Contributed
Contributors
Details
Original language | English |
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Pages (from-to) | 392-396 |
Number of pages | 5 |
Journal | Semiconductors |
Issue number | 4 |
Publication status | Published - 1998 |
Peer-reviewed | No |
External IDs
Scopus | 0041193059 |
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