Resonant 4f photoelectron diffraction: Insight into Yb compounds

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • D. Yu Usachov - , Saint-Petersburg State University, Moscow Institute of Physics and Technology, National University of Science and Technology "MISiS" (Author)
  • G. Poelchen - , Chair of Surface Physics, TUD Dresden University of Technology (Author)
  • I. I. Tupitsyn - , Saint-Petersburg State University (Author)
  • K. A. Bokai - , Saint-Petersburg State University, Moscow Institute of Physics and Technology (Author)
  • D. Glazkova - , Saint-Petersburg State University (Author)
  • A. V. Tarasov - , Saint-Petersburg State University, Moscow Institute of Physics and Technology (Author)
  • M. Mende - , Institute of Solid State and Materials Physics, TUD Dresden University of Technology (Author)
  • Alexander V. Fedorov - , Helmholtz Centre Berlin for Materials and Energy (Author)
  • V. S. Stolyarov - , Moscow Institute of Physics and Technology, National University of Science and Technology "MISiS" (Author)
  • C. Krellner - , Goethe University Frankfurt a.M. (Author)
  • D. V. Vyalikh - , Donostia International Physics Center, Ikerbasque Basque Foundation for Science (Author)

Abstract

Resonant photoelectron diffraction (RPED) and its use for studies of lanthanides are presented. To demonstrate the potential of this technique, we show how the ground-state properties of the heavy-fermion compound YbRh2Si2 and its trivalent counterpart YbCo2Si2 can be determined from RPED measurements and modeling. By providing a modeling recipe and exploring RPED capabilities and limitations, we anticipate wide applications of this method for insights into the properties of lanthanide-based systems.

Details

Original languageEnglish
Article numberL241118
JournalPhysical Review B
Volume109
Issue number24
Publication statusPublished - 15 Jun 2024
Peer-reviewedYes

Keywords

ASJC Scopus subject areas