Resonant 4f photoelectron diffraction: Insight into Yb compounds

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • D. Yu Usachov - , St. Petersburg State University, Moscow Institute of Physics and Technology, National University of Science and Technology "MISiS" (Autor:in)
  • G. Poelchen - , Professur für Oberflächenphysik, Technische Universität Dresden (Autor:in)
  • I. I. Tupitsyn - , St. Petersburg State University (Autor:in)
  • K. A. Bokai - , St. Petersburg State University, Moscow Institute of Physics and Technology (Autor:in)
  • D. Glazkova - , St. Petersburg State University (Autor:in)
  • A. V. Tarasov - , St. Petersburg State University, Moscow Institute of Physics and Technology (Autor:in)
  • M. Mende - , Institut für Festkörper- und Materialphysik, Technische Universität Dresden (Autor:in)
  • Alexander V. Fedorov - , Helmholtz-Zentrum Berlin für Materialien und Energie (HZB) (Autor:in)
  • V. S. Stolyarov - , Moscow Institute of Physics and Technology, National University of Science and Technology "MISiS" (Autor:in)
  • C. Krellner - , Johann Wolfgang Goethe-Universität Frankfurt am Main (Autor:in)
  • D. V. Vyalikh - , Donostia International Physics Center, Ikerbasque Basque Foundation for Science (Autor:in)

Abstract

Resonant photoelectron diffraction (RPED) and its use for studies of lanthanides are presented. To demonstrate the potential of this technique, we show how the ground-state properties of the heavy-fermion compound YbRh2Si2 and its trivalent counterpart YbCo2Si2 can be determined from RPED measurements and modeling. By providing a modeling recipe and exploring RPED capabilities and limitations, we anticipate wide applications of this method for insights into the properties of lanthanide-based systems.

Details

OriginalspracheEnglisch
AufsatznummerL241118
FachzeitschriftPhysical Review B
Jahrgang109
Ausgabenummer24
PublikationsstatusVeröffentlicht - 15 Juni 2024
Peer-Review-StatusJa