Reliability improvement of ferroelectric hf0.5zr0.5o2 thin films by lanthanum doping for feram applications

Research output: Contribution to conferencesPaperContributedpeer-review

Contributors

  • Furqan Mehmood - , TUD Dresden University of Technology (Author)
  • Thomas Mikolajick - , Chair of Nanoelectronics, TUD Dresden University of Technology (Author)
  • Uwe Schroeder - , TUD Dresden University of Technology (Author)

Details

Original languageEnglish
Publication statusPublished - 2020
Peer-reviewedYes

Conference

Title2020 Device Research Conference, DRC 2020
Duration21 - 24 June 2020
CityColumbus
CountryUnited States of America

External IDs

ORCID /0000-0003-3814-0378/work/142256186

Keywords

ASJC Scopus subject areas