Reliability improvement of ferroelectric hf0.5zr0.5o2 thin films by lanthanum doping for feram applications
Research output: Contribution to conferences › Paper › Contributed › peer-review
Contributors
Details
Original language | English |
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Publication status | Published - 2020 |
Peer-reviewed | Yes |
Conference
Title | 2020 Device Research Conference, DRC 2020 |
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Duration | 21 - 24 June 2020 |
City | Columbus |
Country | United States of America |
External IDs
ORCID | /0000-0003-3814-0378/work/142256186 |
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