Recognizing and Integrating Legacy Assembly Diagrams into Industry 4.0

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Abstract

Legacy assembly diagrams, often provided as machine-unreadable images, hinder integration into the Industry 4.0 (I4.0) ecosystem. We propose a multi-step pipeline leveraging Large Language Models as a single simple-to-operate tool to recognize parts, relationships, and global identifiers, segment parts in images, and structure the data into Asset Administration Shell as I4.0 digital twins. Targeted prompts are designed for each step and evaluated on 15 diverse real-world diagrams. Results show that while the LLM reliably recognizes parts and link identifiers, there are still some open challenges with relationship extraction and semantic segmentation. Despite these limitations, LLMs provide a viable tool for semi-automated digitalization. Our end-to-end pipeline thus enables seamless integration of legacy diagrams into I4.0 systems.

Details

Original languageEnglish
Title of host publicationIECON 2025 – 51st Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE Industrial Electronics Society
Pages1-6
Number of pages6
ISBN (electronic)9798331596811
ISBN (print)979-8-3315-9682-8
Publication statusPublished - 17 Oct 2025
Peer-reviewedYes

Conference

Title51st Annual Conference of the IEEE Industrial Electronics Society
Abbreviated titleIECON 2025
Conference number51
Duration14 - 17 October 2025
Website
LocationHotel Meliá Castilla
CityMadrid
CountrySpain

External IDs

ORCID /0000-0002-4646-4455/work/199961442
ORCID /0009-0000-2432-5529/work/199961653

Keywords

Keywords

  • Assembly, Explosions, Fourth Industrial Revolution, Image recognition, Industrial electronics, Large language models, Periodic structures, Pipelines, Reliability, Semantic segmentation