Pulsed stress behavior of PEDOT:PSS thin films

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Contributors

  • D. Bonfert - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • G. Klink - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • K. Bock - , Chair of Electronic Packaging Technology, Fraunhofer Institute for Reliability and Microintegration (Author)
  • P. Svasta - , Polytechnic University of Bucharest (Author)
  • C. Ionescu - , Polytechnic University of Bucharest (Author)

Abstract

There is a necessity to include sensors (resistors) in the design of organic electronic devices in order to extend the range ofpossible applications, mentioned in the last iNEMI roadmap. It is essential to identify potential organic resistive materials, the processes and methods to structure them and to characterize their resistive properties on flexible substrates. A material widely used in organic electronics is the intrinsically conductive polymer (ICP) poly (3, 4-ethylendioxythiophene) doped with polystyrene sulfonate acid (PEDOT:PSS). In this paper wefocus on the pulsed stress behavior ofthis conductive polymer, normally used as a conductive layer and the resulting changes of the resistive properties.

Details

Original languageEnglish
Title of host publication2009 15th International Symposium for Design and Technology of Electronics Packages (SIITME)
Place of PublicationGyula
PublisherIEEE Xplore
Pages75-80
Number of pages6
ISBN (electronic)978-1-4244-5133-3
ISBN (print)978-1-4244-5132-6
Publication statusPublished - 2009
Peer-reviewedYes

Publication series

SeriesInternational Symposium for Design and Technology of Electronics Packages (SIITME)
ISSN2642-7036

Conference

Title15th International Symposium for Design and Technology of Electronics Packages, SIITME 2009
Duration17 - 20 September 2009
CityGyula
CountryHungary

External IDs

ORCID /0000-0002-0757-3325/work/139064958

Keywords