Pulsed stress behavior of flexible thick film resistors

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

  • D. Bonfert - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • H. Wolf - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • H. Gieser - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • G. Klink - , Fraunhofer Institute for Reliability and Microintegration (Author)
  • K. Bock - , Chair of Electronic Packaging Technology, Fraunhofer Institute for Reliability and Microintegration (Author)
  • P. Svasta - , Polytechnic University of Bucharest (Author)
  • C. Ionescu - , Polytechnic University of Bucharest (Author)

Abstract

In order to investigate the behavior for very high current densities of polymer resistors on flexible substrates, a pulsed measurement technique was applied. The analytical test technique of Transmission Line Pulsing (TLP) allows, on the basis of square pulses, the in-situ monitoring of the voltages and currents at the Device Under Test (DUT) during pulsing and helps to gain fundamental insights into the electrical behavior at higher current densities. The influence of the pulse amplitude on the current-voltage behavior was investigated on thick film carbon-based polymer resistors on flexible foil, like polyimide (Upilex). The resistance change due to an applied high voltage pulse stress is a measure of the ESD susceptibility of the thick film polymer resistors. The measurements show that the thick film flexible, carbon based resistors on Upilex foil are susceptible to high energy pulses. Parametric failure or catastrophic damage can occur.

Details

Original languageEnglish
Title of host publication2008 31st International Spring Seminar on Electronics Technology
PublisherIEEE Xplore
Pages45-50
Number of pages6
ISBN (electronic)978-1-4244-3974-4
ISBN (print)978-1-4244-3973-7, 978-1-4244-3972-0
Publication statusPublished - 2008
Peer-reviewedYes

Publication series

SeriesInternational Spring Seminar on Electronics Technology (ISSE)
ISSN2161-2528

Conference

Title2008 31st International Spring Seminar on Electronics Technology
SubtitleReliability and Life-time Prediction
Abbreviated titleISSE 2008
Conference number31
Duration7 - 11 May 2008
CityBudapest
CountryHungary

External IDs

ORCID /0000-0002-0757-3325/work/139064962

Keywords

Keywords

  • ESD, Flexible thick film resistors, Pulsed stress, Transmission line pulsing