Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces

Research output: Contribution to journalReview articleContributedpeer-review

Contributors

  • Eline M. Hutter - , AMOLF, Utrecht University (Author)
  • Thomas Kirchartz - , Jülich Research Centre, University of Duisburg-Essen (Author)
  • Bruno Ehrler - , AMOLF (Author)
  • David Cahen - , Weizmann Institute of Science, Bar-Ilan University (Author)
  • Elizabeth Von Hauff - , AMOLF, Vrije Universiteit Amsterdam (VU) (Author)

Abstract

Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave and time-resolved photoluminescence to understand non-radiative losses and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer and its impact on solar cell efficiency.

Details

Original languageEnglish
Article number100501
JournalApplied physics letters
Volume116
Issue number10
Publication statusPublished - 9 Mar 2020
Peer-reviewedYes
Externally publishedYes

External IDs

ORCID /0000-0002-6269-0540/work/172082544

Keywords

ASJC Scopus subject areas