Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces

Publikation: Beitrag in FachzeitschriftÜbersichtsartikel (Review)BeigetragenBegutachtung

Beitragende

  • Eline M. Hutter - , AMOLF, Utrecht University (Autor:in)
  • Thomas Kirchartz - , Forschungszentrum Jülich, Universität Duisburg-Essen (Autor:in)
  • Bruno Ehrler - , AMOLF (Autor:in)
  • David Cahen - , Weizmann Institute of Science, Bar-Ilan University (Autor:in)
  • Elizabeth Von Hauff - , AMOLF, Vrije Universiteit Amsterdam (VU) (Autor:in)

Abstract

Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave and time-resolved photoluminescence to understand non-radiative losses and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer and its impact on solar cell efficiency.

Details

OriginalspracheEnglisch
Aufsatznummer100501
FachzeitschriftApplied physics letters
Jahrgang116
Ausgabenummer10
PublikationsstatusVeröffentlicht - 9 März 2020
Peer-Review-StatusJa
Extern publiziertJa

Externe IDs

ORCID /0000-0002-6269-0540/work/172082544

Schlagworte

ASJC Scopus Sachgebiete