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Parametric design in Reverse Engineering based on CT data

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

Dirk Hofmann - , Chair of Virtual Product Development, Chair of Electronic Packaging Technology (Author)
Philipp Sembdner - , Chair of Virtual Product Development (Author)
Stefan Holtzhausen - , Chair of Virtual Product Development (Author)
Christine Schöne - (Author)
Ralph Stelzer - , Chair of Virtual Product Development (Author)

Details

Original language	German
Title of host publication	The e-Journal of Nondestructive Testing
Volume	21
Edition	2
ISBN (electronic)	1435-4934
Publication status	Published - 2016
Peer-reviewed	Yes