OpenSpeckle: Open science principles in shearography and ESPI
Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Contributors
Abstract
Shearography and electronic speckle pattern interferometry (ESPI) have historically been developed in limited collaboration. Both techniques have a significant entry barrier for new researchers to get reliable results. The situation is even worse regarding data and code availability: only three documented and publicly available shearography datasets and very limited open software realisations exist. The data sharing aspect gets more critical. First, AI developments are well reported, while only two datasets were published. Second, developments in phase processing are reported without publicly available code. This limits reproducing and validating the results. Following an example from open data challenges in digital image correlation (DIC), this presentation highlights the Open Science issues and proposes three shearography datasets with inspection of composites. This presentation intends to initiate a discussion in the field that could lead to better practices on data and code sharing.
Details
| Original language | English |
|---|---|
| Title of host publication | Optical Measurement Systems for Industrial Inspection XIV |
| Editors | Peter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves jr. |
| Publisher | SPIE - The international society for optics and photonics |
| Number of pages | 7 |
| ISBN (electronic) | 9781510690424 |
| Publication status | Published - 8 Aug 2025 |
| Peer-reviewed | Yes |
Publication series
| Series | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 13567 |
| ISSN | 0277-786X |
Conference
| Title | Optical Measurement Systems for Industrial Inspection XIV |
|---|---|
| Conference number | 14 |
| Description | part of SPIE Optical Metrology 2025 |
| Duration | 23 - 27 June 2025 |
| City | München |
| Country | Germany |
External IDs
| ORCID | /0000-0002-6817-1020/work/190572606 |
|---|---|
| ORCID | /0000-0003-2653-7546/work/190572718 |
| unpaywall | 10.1117/12.3061875 |
Keywords
ASJC Scopus subject areas
Keywords
- ESPI, non-destructive inspection, optical metrology, shearography, speckle interferometry