OpenSpeckle: Open science principles in shearography and ESPI

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Abstract

Shearography and electronic speckle pattern interferometry (ESPI) have historically been developed in limited collaboration. Both techniques have a significant entry barrier for new researchers to get reliable results. The situation is even worse regarding data and code availability: only three documented and publicly available shearography datasets and very limited open software realisations exist. The data sharing aspect gets more critical. First, AI developments are well reported, while only two datasets were published. Second, developments in phase processing are reported without publicly available code. This limits reproducing and validating the results. Following an example from open data challenges in digital image correlation (DIC), this presentation highlights the Open Science issues and proposes three shearography datasets with inspection of composites. This presentation intends to initiate a discussion in the field that could lead to better practices on data and code sharing.

Details

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XIV
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves jr.
PublisherSPIE - The international society for optics and photonics
Number of pages7
ISBN (electronic)9781510690424
Publication statusPublished - 8 Aug 2025
Peer-reviewedYes

Publication series

SeriesProceedings of SPIE - The International Society for Optical Engineering
Volume13567
ISSN0277-786X

Conference

TitleOptical Measurement Systems for Industrial Inspection XIV
Conference number14
Descriptionpart of SPIE Optical Metrology 2025
Duration23 - 27 June 2025
CityMünchen
CountryGermany

External IDs

ORCID /0000-0002-6817-1020/work/190572606
ORCID /0000-0003-2653-7546/work/190572718
unpaywall 10.1117/12.3061875

Keywords

Keywords

  • ESPI, non-destructive inspection, optical metrology, shearography, speckle interferometry