On the Potential of Ambipolar Schottky-Based Ferroelectric Transistor Designs for Enhanced Memory Windows in Scaled Devices
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Ferroelectric memory devices have seen intense interest over the last decade. However, in heavily scaled devices such as silicon-on-insulator (SOI), FinFETs, and nanowire-based FETs the observed ferroelectric memory window (MW) is heavily degraded owing to the fact that additional majority carriers cannot be sourced as there is no 'bulk.' Thus, the device never enters accumulation and polarization switching is suppressed due to the semiconductor channel remaining depleted. Here, we promote an ambipolar Schottky-based ferroelectric transistor (AS-FeFET) as an alternative design. We demonstrate that such devices - owing to their ambipolar nature and thus the ability to source both types of carriers - exhibit MWs that are consistently ∼40%-60% larger than conventional devices for the same programming conditions. Although these devices do suffer from a reduced on-current, this tradeoff remains very attractive for many applications.
Details
Original language | English |
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Pages (from-to) | 6686-6690 |
Number of pages | 5 |
Journal | IEEE Transactions on Electron Devices |
Volume | 71(2024) |
Issue number | 11 |
Publication status | Published - 2024 |
Peer-reviewed | Yes |
External IDs
ORCID | /0000-0003-3814-0378/work/180371976 |
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Keywords
ASJC Scopus subject areas
Keywords
- Ferroelectric devices, ferroelectric transistors (FeFETs), memory window (MW) degradation, Schottky transistors