On the Potential of Ambipolar Schottky-Based Ferroelectric Transistor Designs for Enhanced Memory Windows in Scaled Devices

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Mischa Thesberg - , Global TCAD Solutions GmbH (Author)
  • Tetiana Obukhova - , National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute" (Author)
  • Damien Deleruyelle - , Lyon Institute Of Nanotechnology (Author)
  • Jens Trommer - , NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • Thomas Mikolajick - , Chair of Nanoelectronics, NaMLab - Nanoelectronic materials laboratory gGmbH (Author)
  • Oskar Baumgartner - , Global TCAD Solutions GmbH (Author)
  • Franz Schanovsky - , Global TCAD Solutions GmbH (Author)
  • Zlatan Stanojevic - , Global TCAD Solutions GmbH (Author)
  • Markus Karner - , Global TCAD Solutions GmbH (Author)

Abstract

Ferroelectric memory devices have seen intense interest over the last decade. However, in heavily scaled devices such as silicon-on-insulator (SOI), FinFETs, and nanowire-based FETs the observed ferroelectric memory window (MW) is heavily degraded owing to the fact that additional majority carriers cannot be sourced as there is no 'bulk.' Thus, the device never enters accumulation and polarization switching is suppressed due to the semiconductor channel remaining depleted. Here, we promote an ambipolar Schottky-based ferroelectric transistor (AS-FeFET) as an alternative design. We demonstrate that such devices - owing to their ambipolar nature and thus the ability to source both types of carriers - exhibit MWs that are consistently ∼40%-60% larger than conventional devices for the same programming conditions. Although these devices do suffer from a reduced on-current, this tradeoff remains very attractive for many applications.

Details

Original languageEnglish
Pages (from-to)6686-6690
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume71(2024)
Issue number11
Publication statusPublished - 2024
Peer-reviewedYes

External IDs

ORCID /0000-0003-3814-0378/work/180371976

Keywords

Keywords

  • Ferroelectric devices, ferroelectric transistors (FeFETs), memory window (MW) degradation, Schottky transistors