Noise investigations of 90 nm VLSI CMOS technologies for analog integratedcircuits at millimeter wave frequencies

Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review

Contributors

Details

Original languageEnglish
Title of host publicationSPIE Conference on Noise and Fluctuations
Pages131-138
Number of pages8
Publication statusPublished - 1 Dec 2004
Peer-reviewedYes

Keywords