Next Generation Ferroelectric Memories enabled by Hafnium Oxide

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Details

Original languageEnglish
Title of host publication2018 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
Publication statusPublished - 2019
Peer-reviewedYes

External IDs

ORCID /0000-0003-3814-0378/work/142256134

Keywords