Next Generation Ferroelectric Memories enabled by Hafnium Oxide
Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Contributors
Details
| Original language | English |
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| Title of host publication | 2018 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) |
| Publication status | Published - 2019 |
| Peer-reviewed | Yes |
External IDs
| ORCID | /0000-0003-3814-0378/work/142256134 |
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