New fast short circuit detection method for SiC and GaN HEMT power semiconductors
Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review
Contributors
Abstract
Different short circuit detection and protection methods for Insulated Gate Bipolar Transistor (IGBT) have been established over the last years. Also new methods for wide bandgap power semiconductors were introduced. Short circuit detection schemes using the power loop stray inductance or an additional shunt are disadvantageous, since a low commutation loop inductance is desired to limit the overvoltage during fast switching events. In this paper a new fast short circuit detection method based on a desaturation detection circuit is presented. The new method is evaluated using LTSpice. Furthermore an evaluation board for experimental verification was developed.
Details
Original language | English |
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Title of host publication | PCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2019 |
Publisher | Mesago PCIM GmbH |
Pages | 1498-1505 |
Number of pages | 8 |
ISBN (print) | 9783800749386 |
Publication status | Published - 2019 |
Peer-reviewed | Yes |
Publication series
Series | PCIM Europe Conference Proceedings |
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Conference
Title | 2019 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management |
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Abbreviated title | PCIM Europe 2019 |
Duration | 7 - 9 May 2019 |
Location | Messe Nürnberg |
City | Nürnberg |
Country | Germany |