New fast short circuit detection method for SiC and GaN HEMT power semiconductors

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Abstract

Different short circuit detection and protection methods for Insulated Gate Bipolar Transistor (IGBT) have been established over the last years. Also new methods for wide bandgap power semiconductors were introduced. Short circuit detection schemes using the power loop stray inductance or an additional shunt are disadvantageous, since a low commutation loop inductance is desired to limit the overvoltage during fast switching events. In this paper a new fast short circuit detection method based on a desaturation detection circuit is presented. The new method is evaluated using LTSpice. Furthermore an evaluation board for experimental verification was developed.

Details

Original languageEnglish
Title of host publicationPCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2019
PublisherMesago PCIM GmbH
Pages1498-1505
Number of pages8
ISBN (print)9783800749386
Publication statusPublished - 2019
Peer-reviewedYes

Publication series

SeriesPCIM Europe Conference Proceedings

Conference

Title2019 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Abbreviated titlePCIM Europe 2019
Duration7 - 9 May 2019
LocationMesse Nürnberg
CityNürnberg
CountryGermany

Keywords

ASJC Scopus subject areas