New fast short circuit detection method for SiC and GaN HEMT power semiconductors

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Abstract

Different short circuit detection and protection methods for Insulated Gate Bipolar Transistor (IGBT) have been established over the last years. Also new methods for wide bandgap power semiconductors were introduced. Short circuit detection schemes using the power loop stray inductance or an additional shunt are disadvantageous, since a low commutation loop inductance is desired to limit the overvoltage during fast switching events. In this paper a new fast short circuit detection method based on a desaturation detection circuit is presented. The new method is evaluated using LTSpice. Furthermore an evaluation board for experimental verification was developed.

Details

OriginalspracheEnglisch
TitelPCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2019
Herausgeber (Verlag)Mesago PCIM GmbH
Seiten1498-1505
Seitenumfang8
ISBN (Print)9783800749386
PublikationsstatusVeröffentlicht - 2019
Peer-Review-StatusJa

Publikationsreihe

ReihePCIM Europe Conference Proceedings

Konferenz

Titel2019 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
KurztitelPCIM Europe 2019
Dauer7 - 9 Mai 2019
OrtMesse Nürnberg
StadtNürnberg
LandDeutschland

Schlagworte

ASJC Scopus Sachgebiete