Multi-resolution characterisation of grain-based measurements from x-ray tomography
Research output: Contribution to conferences › Paper › Contributed › peer-review
Details
| Original language | English |
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| Publication status | Published - 2015 |
| Peer-reviewed | Yes |
Conference
| Title | 2nd International Conference on Tomography of Materials and Structures |
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| Conference number | |
| Duration | 1 July 2015 |
| Degree of recognition | International event |
| Location | |
| City |
Keywords
Keywords
- x-ray tomography, inter - particle contacts, subpixel resolution