MODULATED ELLIPSOMETRY FOR CHARACTERIZATION OF MULTIPLE-QUANTUM WELLS AND SUPERLATTICES
Research output: Contribution to journal › Research article › Contributed
Contributors
Details
| Original language | German |
|---|---|
| Pages (from-to) | 112-116 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Issue number | 1-2 |
| Publication status | Published - 1993 |
| Peer-reviewed | No |
External IDs
| Scopus | 43949165679 |
|---|