Methods for processing a semiconductor substrate

Research output: Intellectual property › Patent application/Patent

Contributors

  • Werner Schustereder - (Inventor)
  • Alexander Breymesser - (Inventor)
  • Mihai Draghici - (Inventor)
  • Tobias Franz Wolfgang Hoechbauer - (Inventor)
  • Wolfgang Lehnert - (Inventor)
  • Hans-Joachim Schulze - (Inventor)
  • Marko David Swoboda - , Siltectra GmbH (Inventor)
  • Infineon Technologies AG

Abstract

Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.

Details

Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.

Original languageEnglish
IPC (International Patent Classification)H01L 21/ 768 A I
Patent numberUS2021159115
Filing date25 Nov 2020
Country/TerritoryUnited States of America
Priority date27 Nov 2019
Priority numberDE201910132158
Publication statusPublished - 27 May 2021
Externally publishedYes
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External IDs

ORCID /0000-0003-2572-1149/work/208796504