Methods for processing a semiconductor substrate

Publikation: Geistiges EigentumPatentanmeldung/Patent

Beitragende

  • Werner Schustereder - (Erfinder:in)
  • Alexander Breymesser - (Erfinder:in)
  • Mihai Draghici - (Erfinder:in)
  • Tobias Franz Wolfgang Hoechbauer - (Erfinder:in)
  • Wolfgang Lehnert - (Erfinder:in)
  • Hans-Joachim Schulze - (Erfinder:in)
  • Marko David Swoboda - , Siltectra GmbH (Erfinder:in)
  • Infineon Technologies AG

Abstract

Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.

Details

Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.

OriginalspracheEnglisch
IPC (Internationale Patentklassifikation)H01L 21/ 768 A I
VeröffentlichungsnummerUS2021159115
Anmeldedatum25 Nov. 2020
Land/GebietUSA/Vereinigte Staaten
Prioritätsdatum27 Nov. 2019
PrioritätsnummerDE201910132158
PublikationsstatusVeröffentlicht - 27 Mai 2021
Extern publiziertJa
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Externe IDs

ORCID /0000-0003-2572-1149/work/208796504