Methods for processing a semiconductor substrate
Publikation: Geistiges Eigentum › Patentanmeldung/Patent
Beitragende
- Infineon Technologies AG
Abstract
Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.
Details
Methods for processing a semiconductor substrate are proposed. An example of a method includes forming cavities in the semiconductor substrate by implanting ions through a first surface of the semiconductor substrate. The cavities define a separation layer in the semiconductor substrate. A semiconductor layer is formed on the first surface of the semiconductor substrate. Semiconductor device elements are formed in the semiconductor layer. The semiconductor substrate is separated along the separation layer into a first substrate part including the semiconductor layer and a second substrate part.
| Originalsprache | Englisch |
|---|---|
| IPC (Internationale Patentklassifikation) | H01L 21/ 768 A I |
| Veröffentlichungsnummer | US2021159115 |
| Anmeldedatum | 25 Nov. 2020 |
| Land/Gebiet | USA/Vereinigte Staaten |
| Prioritätsdatum | 27 Nov. 2019 |
| Prioritätsnummer | DE201910132158 |
| Publikationsstatus | Veröffentlicht - 27 Mai 2021 |
| Extern publiziert | Ja |
Externe IDs
| ORCID | /0000-0003-2572-1149/work/208796504 |
|---|