Method for splitting semiconductor wafers

Research output: Intellectual property › Patent application/Patent

Contributors

  • Christian Beyer - (Inventor)
  • Francisco Javier Santos Rodriguez - (Inventor)
  • Hans-Joachim Schulze - (Inventor)
  • Marko David Swoboda - , Siltectra GmbH (Inventor)
  • Infineon Technologies AG

Abstract

A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.

Details

A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.

Original languageEnglish
IPC (International Patent Classification)H01L 29/ 16 A I
Patent numberUS2023005794
Filing date9 Dec 2020
Country/TerritoryUnited States of America
Priority date9 Dec 2020
Priority numberUS202017781585
Publication statusPublished - 5 Jan 2023
Externally publishedYes
No renderer: customAssociatesEventsRenderPortal,dk.atira.pure.api.shared.model.researchoutput.Patent

External IDs

ORCID /0000-0003-2572-1149/work/208796499