Method for splitting semiconductor wafers
Research output: Intellectual property › Patent application/Patent
Contributors
- Infineon Technologies AG
Abstract
A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.
Details
A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.
| Original language | English |
|---|---|
| IPC (International Patent Classification) | H01L 29/ 16 A I |
| Patent number | US2023005794 |
| Filing date | 9 Dec 2020 |
| Country/Territory | United States of America |
| Priority date | 9 Dec 2020 |
| Priority number | US202017781585 |
| Publication status | Published - 5 Jan 2023 |
| Externally published | Yes |
External IDs
| ORCID | /0000-0003-2572-1149/work/208796499 |
|---|