Method for splitting semiconductor wafers

Publikation: Geistiges EigentumPatentanmeldung/Patent

Beitragende

  • Christian Beyer - (Erfinder:in)
  • Francisco Javier Santos Rodriguez - (Erfinder:in)
  • Hans-Joachim Schulze - (Erfinder:in)
  • Marko David Swoboda - , Siltectra GmbH (Erfinder:in)
  • Infineon Technologies AG

Abstract

A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.

Details

A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.

OriginalspracheEnglisch
IPC (Internationale Patentklassifikation)H01L 29/ 16 A I
VeröffentlichungsnummerUS2023005794
Anmeldedatum9 Dez. 2020
Land/GebietUSA/Vereinigte Staaten
Prioritätsdatum9 Dez. 2020
PrioritätsnummerUS202017781585
PublikationsstatusVeröffentlicht - 5 Jan. 2023
Extern publiziertJa
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Externe IDs

ORCID /0000-0003-2572-1149/work/208796499