Method for splitting semiconductor wafers
Publikation: Geistiges Eigentum › Patentanmeldung/Patent
Beitragende
- Infineon Technologies AG
Abstract
A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.
Details
A method of splitting off a semiconductor wafer from a semiconductor bottle includes: forming a separation region within the semiconductor boule, the separation region having at least one altered physical property which increases thermo-mechanical stress within the separation region relative to the remainder of the semiconductor boule; and applying an external force to the semiconductor boule such that at least one crack propagates along the separation region and a wafer splits from the semiconductor boule.
| Originalsprache | Englisch |
|---|---|
| IPC (Internationale Patentklassifikation) | H01L 29/ 16 A I |
| Veröffentlichungsnummer | US2023005794 |
| Anmeldedatum | 9 Dez. 2020 |
| Land/Gebiet | USA/Vereinigte Staaten |
| Prioritätsdatum | 9 Dez. 2020 |
| Prioritätsnummer | US202017781585 |
| Publikationsstatus | Veröffentlicht - 5 Jan. 2023 |
| Extern publiziert | Ja |
Externe IDs
| ORCID | /0000-0003-2572-1149/work/208796499 |
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