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Managing Variability within Wafertest Production by Combining Lean and Six Sigma

Research output: Contribution to conferences › Paper › Contributed › peer-review

Contributors

Germar Schneider - (Author)
Dietrich Eberts - (Author)
Rainer Lasch - , Chair of Business Administration, esp Logistics (Author)
Sophia Keil - , Chair of Business Administration, esp Logistics (Author)
Oliver Buhmann - (Author)
Ralph Rottnick - (Author)

Details

Original language	English
Publication status	Published - 2012
Peer-reviewed	Yes

Conference

Title	23rd Annual IEEE/SEMI® Advanced Semiconductor Manufacturing Conference (ASMC)
Conference number
Duration	15 May 2012
Location
City

External IDs

ORCID	/0000-0001-6942-3763/work/142252948

Keywords

Keywords

Managing Variability, Logistik, Wafertest Production