Managing subthreshold leakage in charge-based analog circuits with low-V/sub TH/ transistors by analog T- switch (AT-switch) and super cut-off CMOS (SCCMOS)
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
The analog T-switch (AT-switch) scheme is introduced to suppress subthreshold-leakage problems in charge-based analog circuits such as switched capacitors and sample-and-hold circuits. A 0.5-V sigma-delta modulator is manufactured in a 0.15-/spl mu/m FD-SOI process with low V/sub TH/ of 0.1 V using the concept. The scheme is compared with another leakage-suppression scheme based on super cut-off CMOS (SCCMOS) and the conventional circuit which are also fabricated. The sigma-delta modulator based on AT-switch greatly improves 8.1-dB SNDR through reducing nonlinear leakage effects while the modulator based on SCCMOS improves the dynamic range rather than the SNDR by comparing with the conventional sigma-delta modulator.
Details
Original language | English |
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Article number | 1610630 |
Pages (from-to) | 859-867 |
Number of pages | 9 |
Journal | IEEE journal of solid-state circuits |
Volume | 41 |
Issue number | 4 |
Publication status | Published - 1 Apr 2006 |
Peer-reviewed | Yes |
External IDs
Scopus | 33645692081 |
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ORCID | /0000-0002-4152-1203/work/165453384 |
Keywords
Keywords
- Switches, Subthreshold current, Analog circuits, Switching circuits, CMOS analog integrated circuits, Delta-sigma modulation, Voltage, Switched capacitor circuits, Digital circuits, Manufacturing processes