Managing subthreshold leakage in charge-based analog circuits with low-V/sub TH/ transistors by analog T- switch (AT-switch) and super cut-off CMOS (SCCMOS)

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

Abstract

The analog T-switch (AT-switch) scheme is introduced to suppress subthreshold-leakage problems in charge-based analog circuits such as switched capacitors and sample-and-hold circuits. A 0.5-V sigma-delta modulator is manufactured in a 0.15-/spl mu/m FD-SOI process with low V/sub TH/ of 0.1 V using the concept. The scheme is compared with another leakage-suppression scheme based on super cut-off CMOS (SCCMOS) and the conventional circuit which are also fabricated. The sigma-delta modulator based on AT-switch greatly improves 8.1-dB SNDR through reducing nonlinear leakage effects while the modulator based on SCCMOS improves the dynamic range rather than the SNDR by comparing with the conventional sigma-delta modulator.

Details

OriginalspracheEnglisch
Aufsatznummer1610630
Seiten (von - bis)859-867
Seitenumfang9
FachzeitschriftIEEE journal of solid-state circuits
Jahrgang41
Ausgabenummer4
PublikationsstatusVeröffentlicht - 1 Apr. 2006
Peer-Review-StatusJa

Externe IDs

Scopus 33645692081
ORCID /0000-0002-4152-1203/work/165453384

Schlagworte

Schlagwörter

  • Switches, Subthreshold current, Analog circuits, Switching circuits, CMOS analog integrated circuits, Delta-sigma modulation, Voltage, Switched capacitor circuits, Digital circuits, Manufacturing processes