Machine Health diagnostics of Semiconductor Facility equipment

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Contributors

Details

Original languageEnglish
Title of host publicationProceedings of 20th European Advanced Process Control and Manufacturing Conference (apc|m)
Publication statusPublished - 2022
Peer-reviewedYes

Conference

Title20th European Advanced Process Control and Manufacturing Conference
Abbreviated titleapc|m 2022
Conference number20
Duration4 - 6 April 2022
Website
Degree of recognitionInternational event
LocationPalais des Congrès Neptune
CityToulon
CountryFrance

External IDs

ORCID /0000-0002-6824-3549/work/142236897