Live demonstration: A TiO2 ReRAM parameter extraction method

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • Ioannis Messaris - , Aristotle University of Thessaloniki (Author)
  • Spyridon Nikolaidis - , Aristotle University of Thessaloniki (Author)
  • Alexandru Serb - , University of Southampton (Author)
  • Spyros Stathopoulos - , University of Southampton (Author)
  • Isha Gupta - , University of Southampton (Author)
  • Ali Khiat - , University of Southampton (Author)
  • Themistoklis Prodromakis - , University of Southampton (Author)

Abstract

We demonstrate a desktop platform which has the ability of modeling ReRAM TiO2 samples in a highly automated manner. The system consists of a bespoke RRAM characterization instrument that hosts packaged RRAM devices and is operated via a PC. The system's python-based software includes a module that automatically applies strategically chosen sequences of pulses to a test device and then extracts the suitable parameter values for a resistive switching model from the elicited response.

Details

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Circuits and Systems (ISCAS)
PublisherIEEE Xplore
Pages1-1
Number of pages1
ISBN (electronic)978-1-4673-6853-7
ISBN (print)978-1-5090-1427-9
Publication statusPublished - 31 May 2017
Peer-reviewedYes
Externally publishedYes

Publication series

SeriesIEEE International Symposium on Circuits and Systems (ISCAS)
ISSN0271-4302

Conference

TitleIEEE International Symposium on Circuits and Systems 2017
Abbreviated titleISCAS 2017
Conference number50
Duration28 - 31 May 2017
CityBaltimore
CountryUnited States of America

External IDs

Scopus 85032671735

Keywords

Keywords

  • Solid modeling, Switches, Computational modeling, Parameter extraction, Testing, Instruments, Memristors

Library keywords