Live demonstration: A TiO2 ReRAM parameter extraction method

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung

Beitragende

  • Ioannis Messaris - , Aristotle University of Thessaloniki (Autor:in)
  • Spyridon Nikolaidis - , Aristotle University of Thessaloniki (Autor:in)
  • Alexandru Serb - , University of Southampton (Autor:in)
  • Spyros Stathopoulos - , University of Southampton (Autor:in)
  • Isha Gupta - , University of Southampton (Autor:in)
  • Ali Khiat - , University of Southampton (Autor:in)
  • Themistoklis Prodromakis - , University of Southampton (Autor:in)

Abstract

We demonstrate a desktop platform which has the ability of modeling ReRAM TiO2 samples in a highly automated manner. The system consists of a bespoke RRAM characterization instrument that hosts packaged RRAM devices and is operated via a PC. The system's python-based software includes a module that automatically applies strategically chosen sequences of pulses to a test device and then extracts the suitable parameter values for a resistive switching model from the elicited response.

Details

OriginalspracheEnglisch
Titel2017 IEEE International Symposium on Circuits and Systems (ISCAS)
Herausgeber (Verlag)IEEE Xplore
Seiten1-1
Seitenumfang1
ISBN (elektronisch)978-1-4673-6853-7
ISBN (Print)978-1-5090-1427-9
PublikationsstatusVeröffentlicht - 31 Mai 2017
Peer-Review-StatusJa
Extern publiziertJa

Publikationsreihe

ReiheIEEE International Symposium on Circuits and Systems (ISCAS)
ISSN0271-4302

Konferenz

TitelIEEE International Symposium on Circuits and Systems 2017
KurztitelISCAS 2017
Veranstaltungsnummer50
Dauer28 - 31 Mai 2017
StadtBaltimore
LandUSA/Vereinigte Staaten

Externe IDs

Scopus 85032671735

Schlagworte

Schlagwörter

  • Solid modeling, Switches, Computational modeling, Parameter extraction, Testing, Instruments, Memristors

Bibliotheksschlagworte